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Common Defects Detected Through Semiconductor X-ray Inspection
In the fast-paced world of electronics manufacturing, quality control is paramount. As semiconductors become increasingly complex and miniaturized, traditional inspection methods are no longer sufficient for ensuring defect-free components. This is where semiconductor X-ray inspection plays a critical role. It offers a non-destructive and highly effective way to identify internal defects that would otherwise remain hidden, helping manufacturers maintain quality standards and reduce product failures. This article explores the most common defects that semiconductor X-ray inspection can detect and why this technology is vital in modern electronics manufacturing.